Imaging XPS with a hemispherical analyzer and multichannelplate detection
- 1 May 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 231 (1-2) , 233-239
- https://doi.org/10.1016/0039-6028(90)90716-l
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Experiments on imaging X‐ray analytical methodsSurface and Interface Analysis, 1989
- Influence of concentration gradients and surface roughness on measured reduced thicknesses of overlayersJournal of Electron Spectroscopy and Related Phenomena, 1987
- Imaging and small spot analysis with ESCAJournal of Electron Spectroscopy and Related Phenomena, 1987
- Imaging XPS—a new technique. 2—Experimental verificationSurface and Interface Analysis, 1987
- Quantitative XPS — multiline approachJournal of Electron Spectroscopy and Related Phenomena, 1986
- Imaging XPS—A new technique, I—principlesSurface and Interface Analysis, 1983