On the computation of the ranges of detected delay fault sizes

This publication has 8 references indexed in Scilit:

• Delay test generation. II. Algebra and algorithms
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• On the detection of delay faults
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Delay test generation. I. Concepts and coverage metrics
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Random pattern testability of delay faults
  IEEE Transactions on Computers, 1988
• On Delay Fault Testing in Logic Circuits
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
• Analysis of Timing Failures Due to Random AC Defects in VLSI Modules
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1985
• Modeling and Testing for Timing Faults in Synchronous Sequential Circuits
  IEEE Design & Test of Computers, 1984
• An Experimental Delay Test Generator for LSI Logic
  IEEE Transactions on Computers, 1980