A general characteristic fluorescence correction for the quantitative electron microbeam analysis of thick specimens, thin films and particles
- 1 October 1985
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 14 (4) , 172-182
- https://doi.org/10.1002/xrs.1300140408
Abstract
No abstract availableKeywords
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