Reliability of AlInAs/GaInAs heterojunction bipolar transistors

This publication has 24 references indexed in Scilit:

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  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
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  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
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  IEEE Electron Device Letters, 1992
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  Japanese Journal of Applied Physics, 1991
• High-reliability GaAs-AlGaAs HBTs by MBE with Be base doping and InGaAs emitter contacts
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• Recombination-enhanced impurity diffusion in Be-doped GaAs
  Applied Physics Letters, 1991
• Modeling of self-heating in GaAs/AlGaAs HBTs for accurate circuit and device analysis
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1991