The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 14 (12) , 1557-1568
- https://doi.org/10.1109/43.476585
Abstract
A yield maximization methodology, called the linearized performance penalty (LPP) method, that uses a penalty function as its objective is introduced. The penalty function formulation allows the integration of the goals of circuit performance improvement and yield maximization. It is computationally efficient since the objective function can be evaluated with the computational effort of about one circuit simulation. Also, a simple, yet effective, method to account for operating point variations is introduced. The effectiveness of the LPP method is illustrated through several circuit examplesKeywords
This publication has 21 references indexed in Scilit:
- A new methodology for the design centering of IC fabrication processesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Circuit performance variability reduction: principles, problems, and practical solutionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- PYFS-a statistical optimization method for integrated circuit yield enhancementIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1993
- OPTIMIZATION OF PARAMETRIC YIELD: A TUTORIALInternational Journal of High Speed Electronics and Systems, 1992
- Generation of correlated parameters for statistical circuit simulationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1992
- Matching properties of MOS transistorsIEEE Journal of Solid-State Circuits, 1989
- Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication ParametersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- Transient Sensitivity Computation for MOSFET CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1985
- Stochastic approximation approach to statistical circuit designElectronics Letters, 1983
- The Generalized Adjoint Network and Network SensitivitiesIEEE Transactions on Circuit Theory, 1969