Experimental requirements for the measurement of excess carrier lifetime in semiconductors using microwave techniques
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 39 (6) , 1054-1058
- https://doi.org/10.1109/19.65825
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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