Photoconductivity lifetime measurements on HgCdTe using a contactless microwave technique

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Abstract
Photoconductivity lifetime measurements on narrow band-gap HgCdTe thin films and bulk slices using a contactless microwave reflection technique have been demonstrated for the first time. A horn antenna was used to allow cooling of samples to 77 K outside the waveguide and testings of large-size samples. A good agreement was established between lifetime results from the contactless microwave reflection technique and the standard photoconductivity decay method using two ohmic contacts. The feasibility of lifetime mapping by moving the pulsed light beam to different locations on the samples was also demonstrated.