Spin multiplicity and charge state of a silicon vacancyin-SiC determined by pulsed ENDOR
Open Access
- 28 December 2005
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 72 (23) , 235208
- https://doi.org/10.1103/physrevb.72.235208
Abstract
In this paper, we unambiguously re-determine the spin multiplicity of by pulsed electron nucleus double resonance technique. The center is one of the most commonly observed defects in -SiC, and its origin was identified as one belonging to a class of negatively charged silicon vacancy by means of continuous-wave electron paramagnetic resonance (EPR) and the two-dimensional nutation method of pulsed EPR technique. However, a model with the spin multiplicity of triplet and the neutral charge state has recently been suggested. Our result clearly shows that is a quartet spin state and thus should be single-negatively charged .
Keywords
This publication has 27 references indexed in Scilit:
- Optical and EPR Signatures of Intrinsic Defects in Ultra High Purity 4H-SiCMaterials Science Forum, 2004
- Defects in High-Purity Semi-Insulating SiCMaterials Science Forum, 2004
- Ab initiostudy of the migration of intrinsic defects inPhysical Review B, 2003
- The Neutral Silicon Vacancy in SiC: Ligand Hyperfine InteractionMaterials Science Forum, 2002
- EPR Study of Single Silicon Vacancy-Related Defects in 4H- and 6H-SiCMaterials Science Forum, 2002
- Silicon vacancy related defect in 4H and 6H SiCPhysical Review B, 2000
- Negatively charged Si vacancy inSiC: A comparison between theory and experimentPhysical Review B, 1997
- EPR identification of the negatively charged vacancy in diamondPhysical Review B, 1992
- Electronic Spin of the Ga Vacancy in GaPPhysical Review Letters, 1983
- Electron paramagnetic resonance of electron-irradiated GaPPhysical Review B, 1981