Dotierungseigenschaften von Nickel in Silizium
- 16 January 1987
- journal article
- localized electronic-states
- Published by Wiley in Physica Status Solidi (a)
- Vol. 99 (1) , 205-213
- https://doi.org/10.1002/pssa.2210990124
Abstract
No abstract availableKeywords
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- Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance techniqueSolid-State Electronics, 1974
- Thermal ionization rates and energies of holes at the double acceptor zinc centers in siliconPhysica Status Solidi (a), 1972
- Electrical Properties of High-Resistivity Nickel-Doped SiliconJournal of Applied Physics, 1970
- Electron Spin Resonance in SemiconductorsPublished by Elsevier ,1962