Investigations of thin films on GaAs using the proton resonant scattering technique
- 1 April 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 30 (4) , 551-556
- https://doi.org/10.1016/0168-583x(88)90132-2
Abstract
No abstract availableKeywords
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