Decompression of test data using variable-length seed LFSRs

This publication has 7 references indexed in Scilit:

• An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• GENERATION OF VECTOR PATTTERNS THROUGH RESEEDING OF MUETIPLE-POLYNOMIAL LINEAR FEEDBACK SHIFT REGIST
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Test set embedding in a built-in self-test environment
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• On linear dependencies in subspaces of LFSR-generated sequences
  IEEE Transactions on Computers, 1996
• Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
  IEEE Transactions on Computers, 1995
• The pseudoexhaustive test of sequential circuits
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1992
• Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing
  IEEE Transactions on Computers, 1983