Process-tolerant test with energy consumption ratio
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 1027-1036
- https://doi.org/10.1109/test.1998.743300
Abstract
We develop a new technique for fault detection based on a new metric, the energy consumption ratio (ECR). ECR-based test can detect faults, such as redundant faults, that escape detection with other techniques. Though the ECR is a metric based on the supply current, an analog parameter, it is remarkably tolerant to the impact of process variations. The quality of ECR-based test is demonstrated through extensive simulation on a process offered by MOSIS. We also present a test generation algorithm for the new test technique. When applied to benchmark circuits, this technique reliably detects a large fraction of the combinationally redundant faults in them.Keywords
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