Fastpath: a path-delay test generator for standard scan designs
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 154-163
- https://doi.org/10.1109/test.1994.527946
Abstract
Fastpath generates non-robust, robust or single-path-sensitization hazard-free robust path-delay tests for standard scan designs including high-impedance elements and functionally-described blocks. Results show effective and memory-efficient operation.Keywords
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