How To Do Weighted Random Testing For Bist?

This publication has 9 references indexed in Scilit:

• 3-Weight Pseudo-Random Test Generation Based on a Deterministic Test Set
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• How To Do Weighted Random Testing For Bist?
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Test set embedding in a built-in self-test environment
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• On numerical weight optimization for random testing
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Built-in self-test with weighted random pattern hardware
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A new procedure for weighted random built-in self-test
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• On computing optimized input probabilities for random tests
  Published by Association for Computing Machinery (ACM) ,1987
• Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test
  IBM Journal of Research and Development, 1983
• The Weighted Random Test-Pattern Generator
  IEEE Transactions on Computers, 1975