Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by Fast Ions
- 1 September 1992
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 31 (9A) , L1284
- https://doi.org/10.1143/jjap.31.l1284
Abstract
High-quality images of the ion-beam shadowing effect in single crystals have been constructed with keV secondary electrons induced by 60-MeV oxygen ions. Under a high count rate (∼104 counts/s) of the electron yield, the time needed to measure the electron yield for about 3000 tilt angles, from which the shadowlng pattern for a 1°×1° angular space (for two independent tilts) was obtained, was 40-60 min when accumulating the electron yield up to 5000-10000 counts per tilt angle. This practical method for visualizing the crystal lattice is suitable for characterization of crystalline materials.Keywords
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