LSI Testing Techniques
- 1 February 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Micro
- Vol. 3 (1) , 34-51
- https://doi.org/10.1109/mm.1983.291070
Abstract
Tests good for SSI and MSI circuits can't cope with the complexity of LSI. New techniques for test generation and response evaluation are required.Keywords
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