A Comparative Evaluation of Integrated Injection Logic
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 24 (6) , 2327-2335
- https://doi.org/10.1109/tns.1977.4329216
Abstract
Radiation effects on integrated injection logic arrays are presented in terms of available data on "conventional" structures and new test data on advanced structures. The advanced structures were developed for improved electrical performance, independent of radiation hardness. These results are used as a basis of reviewing the considerations in hardened I2L development as an LSI technology in comparison to other contemporary LSI technologies.Keywords
This publication has 9 references indexed in Scilit:
- The multifacets of I2L: Exploiting a technique once assumed merely to encourage annoying parasitics, integrated injection logic is burgeoningIEEE Spectrum, 1977
- Second generation I/sup 2/L/MTL: a 20 ns process/structureIEEE Journal of Solid-State Circuits, 1977
- A new high speed I/sup 2/L structureIEEE Journal of Solid-State Circuits, 1977
- Evaluation of technology options for LSI processing elementsProceedings of the IEEE, 1976
- Development of a Hard MicrocontrollerIEEE Transactions on Nuclear Science, 1976
- Radiation Damage to Integrated Injection Logic CellsIEEE Transactions on Nuclear Science, 1975
- Radiation Effects on Bipolar Integrated Injection LogicIEEE Transactions on Nuclear Science, 1975
- Device physics of integrated injection logicIEEE Transactions on Electron Devices, 1975
- Substrate fed logic - An improved form of injection logicPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1974