A Comparative Evaluation of Integrated Injection Logic

Abstract
Radiation effects on integrated injection logic arrays are presented in terms of available data on "conventional" structures and new test data on advanced structures. The advanced structures were developed for improved electrical performance, independent of radiation hardness. These results are used as a basis of reviewing the considerations in hardened I2L development as an LSI technology in comparison to other contemporary LSI technologies.

This publication has 9 references indexed in Scilit: