Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

This publication has 24 references indexed in Scilit:

• Charge retention in scaled SONOS nonvolatile semiconductor memory devices—Modeling and characterization
  Solid-State Electronics, 1993
• Charge retention of MNOS devices limited by Frenkel-Poole detrapping
  Applied Physics Letters, 1978
• Endurance and memory decay of MNOS devices
  Journal of Applied Physics, 1976
• Discharge of MNOS structures at elevated temperatures
  Solid-State Electronics, 1976
• Electrical and Irradiation Performance of MNOS Arrays
  Japanese Journal of Applied Physics, 1974
• Trap-assisted charge injection in MNOS structures
  Journal of Applied Physics, 1973
• Discharge of MNOS structures
  Solid-State Electronics, 1973
• Characterization of thin-oxide MNOS memory transistors
  IEEE Transactions on Electron Devices, 1972
• Degradation of MNOS Memory Transistor Characteristics and Failure Mechanism Model
  8th Reliability Physics Symposium, 1972
• The variable threshold transistor, a new electrically-alterable, non-destructive read-only storage device
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1967