Saturated defect densities of hydrogenated amorphous silicon grown by hot-wire chemical vapor deposition at rates up to 150 Å/s
- 11 June 2001
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 78 (24) , 3788-3790
- https://doi.org/10.1063/1.1375008
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Structural changes infilm crystallinity with high H dilutionPhysical Review B, 2000
- Hydrogenated Amorphous Silicon Grown by Hot-Wire CVD at Deposition Rates up to 1 µm/minuteMRS Proceedings, 2000
- Study of the Amorphous-to-Microcrystalline Transition during Silicon Film Growth at Increased Rates: Extensions of the Evolutionary Phase DiagramMRS Proceedings, 2000
- Low Hydrogen Content, High Quality Hydrogenated Amorphous Silicon Grown by Hot-Wire CVDMRS Proceedings, 1999
- Preparation of a-Si:H and a-SiGe:H I-Layers for Nip Solar Cells at High Deposition Rates Using a Very High Frequency TechniqueMRS Proceedings, 1998
- High deposition rate amorphous silicon-based multijunction solar cellApplied Physics Letters, 1995
- Effect of Light Soaking on Hot Wire Deposited a-Si:H FilmsMRS Proceedings, 1995
- Effect of carbon impurities on the density of states and the stability of hydrogenated amorphous siliconPhysical Review B, 1994
- Light Induced Defects in a-Si:H, Temperature Dependence of their Creation and Anneal and their effect on Photocarrier LifetimeMRS Proceedings, 1994
- Drive-level capacitance profiling: Its application to determining gap state densities in hydrogenated amorphous silicon filmsApplied Physics Letters, 1985