Electrode effects in electrical measurements in SiO thin films
- 31 July 1979
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 31 (4) , 233-236
- https://doi.org/10.1016/0038-1098(79)90601-x
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
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