Comparison of electrical and atomic profiles of Mg24 and Zn64 implanted gaas samples and GaAs-GaAIAs heterostructures for bipolar transistor applications
- 1 November 1986
- journal article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 15 (6) , 377-382
- https://doi.org/10.1007/bf02661888
Abstract
No abstract availableKeywords
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