Comparison of mechanical properties and microstructure of Al(1 wt.%Si) and Al(1 wt.%Si, 0.5 wt.%Cu) thin films
- 1 July 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 263 (2) , 175-184
- https://doi.org/10.1016/0040-6090(95)06556-3
Abstract
No abstract availableKeywords
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