Cole-cole plotting of surface state admittance in MIS capacitors
- 16 December 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 8 (2) , 597-603
- https://doi.org/10.1002/pssa.2210080231
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- CONTRIBUTIONS OF SURFACE STATES TO MOS IMPEDANCEApplied Physics Letters, 1967
- Limitations of the MOS capacitance method for the determination of semiconductor surface propertiesIEEE Transactions on Electron Devices, 1965
- An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodesSolid-State Electronics, 1962
- Dispersion and Absorption in Dielectrics I. Alternating Current CharacteristicsThe Journal of Chemical Physics, 1941