A model relating wearout to breakdown in thin oxides
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (9) , 1570-1580
- https://doi.org/10.1109/16.310108
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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