Analysis of Breakdown Phenomena in MOSFET's
- 1 April 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 1 (2) , 77-85
- https://doi.org/10.1109/tcad.1982.1269997
Abstract
No abstract availableKeywords
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