Programmable memory BIST and a new synthesis framework
- 20 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- On programmable memory built-in self test architecturesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A new framework for automatic generation, insertion and verification of memory built-in self test unitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A BIST scheme using microprogram ROM for large capacity memoriesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Synthesized transparent BIST for detecting scrambled pattern-sensitive faults in RAMsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002