Structural model for the Si(111)-4×1-In reconstruction

Abstract
A π-bonded-chain-stacking-fault (π-SF) model is proposed for the Si(111)4×1-In surface structure. The model incorporates 4×1 Si(111) substrate reconstruction consisting of the sixfold Si rings in the faulted-unfaulted sequence connected through fivefold and sevenfold Si rings. Indium atoms (0.75 ML) reside above sixfold and fivefold Si rings while sevenfold Si rings form π-bonded chains between In ridges.