Effect of X-ray irradiation on MOS capacitors
- 1 January 1982
- journal article
- review article
- Published by Taylor & Francis in Radiation Effects
- Vol. 60 (1) , 161-166
- https://doi.org/10.1080/00337578208242789
Abstract
Experimental results on the effect of X-ray irradiation on dry oxide MOS capacitors are presented. The MOS structure was irradiated when no external bias was applied to it. The results obtained are somewhat peculiar and different from those reported by previous workers.Keywords
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