Effect of fluorescence on the determination of depth distributions by ion induced X-rays
- 1 February 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3) , 445-449
- https://doi.org/10.1016/0029-554x(78)90906-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Determination of the depth of impurity atoms in bulk material by proton-induced x raysJournal of Applied Physics, 1976
- Simple depth profile determination by proton-induced x-ray emissionNuclear Instruments and Methods, 1975
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975
- Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elementsNuclear Instruments and Methods, 1975
- Depth profile determination by ion-induced X-ray spectroscopyNuclear Instruments and Methods, 1974
- The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAsThin Solid Films, 1973
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- Full-range solution for the measurement of thin-film surface densities with proton-excited x raysJournal of Applied Physics, 1972