A multipoint correlation method for bulk trap and interface state measurements in MOS structures from capacitance, voltage, and current transients
- 1 August 1991
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 62 (8) , 1955-1963
- https://doi.org/10.1063/1.1142399
Abstract
No abstract availableKeywords
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