Charge collection from focussed picosecond laser pulses
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6) , 1517-1522
- https://doi.org/10.1109/23.25490
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodesIEEE Transactions on Nuclear Science, 1988
- Charge Collection in Bipolar TransistorsIEEE Transactions on Nuclear Science, 1987
- Laser Simulation of Single Event UpsetsIEEE Transactions on Nuclear Science, 1987
- Charge Transport by the Ion Shunt EffectIEEE Transactions on Nuclear Science, 1986
- Ion Track Shunt Effects in Multi-Junction StructuresIEEE Transactions on Nuclear Science, 1985
- Charge Collection in Multilayer StructuresIEEE Transactions on Nuclear Science, 1984
- Two-Dimensional Simulation of Single Event Indujced Bipolar Current in CMOS StructuresIEEE Transactions on Nuclear Science, 1984
- Charge Funneling in N- and P-Type Si SubstratesIEEE Transactions on Nuclear Science, 1982
- Use of an Ion Microbeam to Study Single Event Upsets in MicrocircuitsIEEE Transactions on Nuclear Science, 1981
- Heavy-Ion Track Structure in SiliconIEEE Transactions on Nuclear Science, 1979