Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction
- 2 February 1997
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 172 (1-2) , 175-182
- https://doi.org/10.1016/s0022-0248(96)00745-2
Abstract
No abstract availableKeywords
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