Influence of silicon-sapphire interface defects on SOS MESFET behavior
- 31 October 1988
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 31 (10) , 1493-1496
- https://doi.org/10.1016/0038-1101(88)90020-2
Abstract
No abstract availableKeywords
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