On the exploitation of thermally stimulated capacitance measurements
- 14 October 1984
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 17 (10) , 2047-2051
- https://doi.org/10.1088/0022-3727/17/10/015
Abstract
A new method for using thermally stimulated capacitance measurement has been developed to study deep levels. This method, based on curve fitting, improves on the original method in two ways. First, it represents a considerable time saving because only a single cooling and heating cycle is needed, and second, this method is less sensitive to possible errors in the determination of the true temperature of the device.Keywords
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