Fabrication and characterization of optoelectronic near-field probes based on an SFM cantilever design
- 31 December 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 61 (1-4) , 131-138
- https://doi.org/10.1016/0304-3991(95)00123-9
Abstract
No abstract availableKeywords
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