Finite element analysis of the effects of geometry and microstructure on electromigration in confined metal lines
- 1 April 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 83 (7) , 3600-3608
- https://doi.org/10.1063/1.366577
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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