A 77-GHz down-conversion mixer architecture with built-in test capability in SiGe technology

Abstract
A 77-GHz double-balanced mixer in a 200 GHz f t silicon-germanium technology is presented. The proposed mixer architecture is capable of simultaneous direct up- and down-conversion of two separate input signals without additional power consumption. An up-converted low-frequency test signal is coupled back into the receiver RF input path to enable a built-in functionality test of the down-conversion path of the mixer. The circuit exhibits a conversion gain of 20 dB and draws 22mA from a 3.3V supply. The fabricated chip occupies an area of 1028 × 1128μm 2 .

This publication has 10 references indexed in Scilit: