Si-Induced Disordering of In0.53Ga0.47As/In0.52Al0.48As Multiquantum Well Structures

Abstract
Disordering of In0.53Ga0.47As/In0.52Al0.48As multiquantum well structures by Si doping and following annealing was demonstrated for the first time. Sputtering Auger electron depth profiling and photoluminescence measurements revealed that a Si-doped In0.53Ga0.47As/In0.52Al0.48As multiquantum well structure is easily disordered during annealing. The mechanism of disordering is discussed based on the fact that disordering takes place when the Si doping level exceeds 1.3×1019 cm-3.