Heavy ion microprobes and their applications
- 1 May 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 77 (1-4) , 8-16
- https://doi.org/10.1016/0168-583x(93)95515-7
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- mubeam system for study of single event upset of semiconductor devicesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- Nuclear microprobe imaging of single-event upsetsIEEE Transactions on Nuclear Science, 1992
- Microbeam Line of MeV Heavy Ions for Materials Modification and In-Situ AnalysisJapanese Journal of Applied Physics, 1990
- Energy-loss radiography with a scanning MeV-ion microprobeNuclear Instruments and Methods in Physics Research, 1983
- Scanning MeV-ion microprobe for light and heavy ionsNuclear Instruments and Methods in Physics Research, 1983
- Production and use of nuclear tracks: imprinting structure on solidsReviews of Modern Physics, 1983
- Investigation of soft upsets in MOS memories with a microbeamNuclear Instruments and Methods in Physics Research, 1981
- Advantages of heavy ions for high-resolution microscopyNuclear Instruments and Methods, 1978
- The use of 6Li and 35Cl ion beams in surface analysisNuclear Instruments and Methods, 1978
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973