Analytic approach to the a.c. conductance method for rapid characterization of interface states in MOS structures
- 31 January 1990
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 33 (1) , 127-137
- https://doi.org/10.1016/0038-1101(90)90018-a
Abstract
No abstract availableKeywords
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