Threshold voltage, field effect mobility, and gate-to-channel capacitance in polysilicon TFTs
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 43 (9) , 1433-1440
- https://doi.org/10.1109/16.535329
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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