Empirical modeling for gate-controlled collector current of lateral bipolar transistors in an n-MOSFET structure
- 1 January 1995
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 38 (1) , 115-119
- https://doi.org/10.1016/0038-1101(94)e0037-f
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- High-gain lateral p-n-p bipolar action in a p-MOSFET structureIEEE Electron Device Letters, 1992
- High-gain lateral bipolar action in a MOSFET structureIEEE Transactions on Electron Devices, 1991
- BSIM: Berkeley short-channel IGFET model for MOS transistorsIEEE Journal of Solid-State Circuits, 1987
- SPICE Modeling for Small Geometry MOSFET CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982
- MOS modelling by analytical approximations. I. Subthreshold current and threshold voltageInternational Journal of Electronics, 1979
- A precise MOSFET model for low-voltage circuitsIEEE Transactions on Electron Devices, 1974
- Low level currents in insulated gate field effect transistorsSolid-State Electronics, 1972
- An investigation of lateral transistors -d.c. characteristicsSolid-State Electronics, 1971