Single-event effects in analog and mixed-signal integrated circuits
- 1 April 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (2) , 594-602
- https://doi.org/10.1109/23.490903
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Overview Of Device See Susceptibility From Heavy IonsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Observation of heavy ion induced transients in linear circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- SEU and SEL response of the Westinghouse 64K E/sup 2/PROM, Analog Devices AD7876 12-bit ADC, and the Intel 82527 serial communications controllerPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Total-dose and SEU results for the AD8001, a high-performance commercial op-amp fabricated in a dielectrically-isolated, complementary-bipolar processPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Single event effects testing of the Crystal CS5327 16-bit ADCPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Spaceflight experiences and lessons learned with NASA's first fiber optic data busPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Transient SEUs in a fiber optic system for space applicationsIEEE Transactions on Nuclear Science, 1991
- Understanding single event phenomena in complex analog and digital integrated circuitsIEEE Transactions on Nuclear Science, 1990
- Radiation-Induced Response of Operational Amplifiers in Low-Level Transient Radiation EnvironmentsIEEE Transactions on Nuclear Science, 1987
- The Natural Radiation Environment inside SpacecraftIEEE Transactions on Nuclear Science, 1982