High-resolution x-ray spectrometer based on a cylindrically bent crystal in nondispersive geometry
- 1 February 1995
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 66 (2) , 1525-1527
- https://doi.org/10.1063/1.1145898
Abstract
The results from a new crystal spectrometer for high-resolution inelastic scattering and resonant Raman scattering spectroscopy are presented. It is based on a cylindrically bent silicon crystal in standard Rowland circle geometry where the energy dispersion is obtained nonconventionally by placing a position sensitive detector perpendicular to the scattering plane. The advantage of this geometry is that the energy dispersion is only about one order of magnitude larger than the intrinsic energy resolution of the instrument, allowing the optimization of the collection efficiency within a narrower energy range of interest while preserving the practical realization of a cylindrically bent crystal. A total energy resolution of 0.7 eV at 8 keV with an energy dispersion of only a few eV was reached. Potential applications of this new geometry as well as comparison with other focusing geometries are also discussed.Keywords
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