CMOS IC transient radiation effects investigations, model verification and parameter extraction with the test structures laser simulation tests
- 24 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
The specialized test chip is designed and investigated for CMOS RAMs dose rate and single event effects research. The laser simulation tests adequacy, taking into account shadowing effect, is analyzed and provided. The original "RADON-5" laser simulator is designed and used as an effective tool for test structures transient radiation models verification and parameter extraction.Keywords
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