40-GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 46 (12) , 2043-2052
- https://doi.org/10.1109/22.739281
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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