Theory and practice of sequential machine testing and testability
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 330-337
- https://doi.org/10.1109/ftcs.1993.627336
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Classification of faults in synchronous sequential circuitsIEEE Transactions on Computers, 1993
- The multiple observation time test strategyIEEE Transactions on Computers, 1992
- On removing redundancy in sequential circuitsPublished by Association for Computing Machinery (ACM) ,1991
- Redundancies and don't cares in sequential logic synthesisJournal of Electronic Testing, 1990
- On Redundancy and Fault Detection in Sequential CircuitsIEEE Transactions on Computers, 1979