The multiple observation time test strategy
- 1 May 1992
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 41 (5) , 627-637
- https://doi.org/10.1109/12.142689
Abstract
This work considers the test generation problem for synchronous sequential circuits in the case where hardware reset is not available (or cannot be assumed to be fault free). We show that the conventional testing approach, by which a fault is detected at a single predetermined time unit along the test sequence, and the response of the circuit under test is compared against a single fault free response, valid for all initial states of the circuit, can cause detectable faults to be declared undetectable. The use of a small number of different observation times and a small number of fault free responses can allow the fault to be detected. Based on this observation, the use of multiple fault free responses and multiple time units for observation of the response of the circuit under test is suggested, and test generation algorithms under the multiple observation time test strategy are given. The multiple observation time strategy is first applied to small to medium circuits, for which a state table description can be given or extracted from a gate level description. The multiple observation time strategy is then applied to medium to large circuits, described in gate level. Experimental results are presented, which demonstrate the effectiveness and practicality of the multiple observation time strategy in increasing the fault coverage.Keywords
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