The role of the InGaAs surface in selective area epitaxy of quantum dots by indium segregation

Abstract
The surface of strained InGaAsfilms for selective regrowth of InAsnanostructures is investigated by atomic force microscopy and Rutherford backscattering. 3.3-nm-thick In 0.33 Ga 0.67 As films were annealed at temperatures between 400 and 800 ° C . Significant indium desorption was found to occur at temperatures above 550 ° C . The optimum parameters are presented for selective growth of InAsquantum dots having densities of 6.6×10 10 cm −2 on In 0.33 Ga 0.67 As films.