X-ray reciprocal space mapping of SiSi1−xGex heterostructures
- 2 December 1995
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 157 (1-4) , 61-67
- https://doi.org/10.1016/0022-0248(95)00372-x
Abstract
No abstract availableKeywords
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